James F. Plusquellic, Amy Germida, Zheng Yan. 8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 68-76, IEEE Computer Society, 1999. [doi]
Abstract is missing.