IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy

Yu Wei P'ng, Moo Kit Lee, Peng Weng Ng, Chin Hu Ong. IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 211, IEEE, 2007. [doi]

Authors

Yu Wei P'ng

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Moo Kit Lee

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Peng Weng Ng

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Chin Hu Ong

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