Yu Wei P'ng, Moo Kit Lee, Peng Weng Ng, Chin Hu Ong. IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 211, IEEE, 2007. [doi]
@inproceedings{PngLNO07,
title = {IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy},
author = {Yu Wei P'ng and Moo Kit Lee and Peng Weng Ng and Chin Hu Ong},
year = {2007},
doi = {10.1109/ATS.2007.36},
url = {https://doi.org/10.1109/ATS.2007.36},
researchr = {https://researchr.org/publication/PngLNO07},
cites = {0},
citedby = {0},
pages = {211},
booktitle = {16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007},
publisher = {IEEE},
isbn = {978-0-7695-2890-8},
}