Jakub Podivinsky, Jakub Lojda, Richard Panek, Ondrej Cekan, Martin Krcma, Zdenek Kotásek. Evaluation Platform For Testing Fault Tolerance: Testing Reliability of Smart Electronic Locks. In 11th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2020, San Jose, Costa Rica, February 25-28, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.