Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Mathias Poik, Mario Mayr, Thomas Hackl, Georg Schitter. Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022. pages 1-6, IEEE, 2022. [doi]

This author has not been identified. Look up 'Mathias Poik' in GoogleThis author has not been identified. Look up 'Mario Mayr' in GoogleThis author has not been identified. Look up 'Thomas Hackl' in GoogleThis author has not been identified. Look up 'Georg Schitter' in Google

runs on WebDSL