Mathias Poik, Mario Mayr, Thomas Hackl, Georg Schitter. Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.