Mathias Poik, Mario Mayr, Thomas Hackl, Georg Schitter. Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{PoikMHS22,
title = {Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes},
author = {Mathias Poik and Mario Mayr and Thomas Hackl and Georg Schitter},
year = {2022},
doi = {10.1109/I2MTC48687.2022.9806639},
url = {https://doi.org/10.1109/I2MTC48687.2022.9806639},
researchr = {https://researchr.org/publication/PoikMHS22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022},
publisher = {IEEE},
isbn = {978-1-6654-8360-5},
}