Ilia Polian, Jens Anders, Steffen Becker 0001, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer 0002, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner 0001. Exploring the Mysteries of System-Level Test. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{PolianABBCESSRW20,
title = {Exploring the Mysteries of System-Level Test},
author = {Ilia Polian and Jens Anders and Steffen Becker 0001 and Paolo Bernardi and Krishnendu Chakrabarty and Nourhan Elhamawy and Matthias Sauer 0002 and Adit D. Singh and Matteo Sonza Reorda and Stefan Wagner 0001},
year = {2020},
doi = {10.1109/ATS49688.2020.9301557},
url = {https://doi.org/10.1109/ATS49688.2020.9301557},
researchr = {https://researchr.org/publication/PolianABBCESSRW20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020},
publisher = {IEEE},
isbn = {978-1-7281-7467-9},
}