Ilia Polian, Jens Anders, Steffen Becker 0001, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer 0002, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner 0001. Exploring the Mysteries of System-Level Test. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.