Multiple Scan Chain Design for Two-Pattern Testing - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Ilia Polian, Bernd Becker. Multiple Scan Chain Design for Two-Pattern Testing. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 88-93, IEEE Computer Society, 2001. [doi]

This author has not been identified. Look up 'Ilia Polian' in GoogleThis author has not been identified. Look up 'Bernd Becker' in Google

runs on WebDSL