Ilia Polian, Bernd Becker. Multiple Scan Chain Design for Two-Pattern Testing. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 88-93, IEEE Computer Society, 2001. [doi]
@inproceedings{PolianB01,
title = {Multiple Scan Chain Design for Two-Pattern Testing},
author = {Ilia Polian and Bernd Becker},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220088abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/PolianB01},
cites = {0},
citedby = {0},
pages = {88-93},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}