Ilia Polian, Sudhakar M. Reddy, Bernd Becker. Scalable Calculation of Logical Masking Effects for Selective Hardening Against Soft Errors. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2008, 7-9 April 2008, Montpellier, France. pages 257-262, IEEE Computer Society, 2008. [doi]
Abstract is missing.