Ilia Polian, Sudhakar M. Reddy, Irith Pomeranz, Xun Tang, Bernd Becker. On Reducing Circuit Malfunctions Caused by Soft Errors. In Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor, editors, 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. pages 245-253, IEEE Computer Society, 2008. [doi]
@inproceedings{PolianRPTB08,
title = {On Reducing Circuit Malfunctions Caused by Soft Errors},
author = {Ilia Polian and Sudhakar M. Reddy and Irith Pomeranz and Xun Tang and Bernd Becker},
year = {2008},
doi = {10.1109/DFT.2008.20},
url = {http://dx.doi.org/10.1109/DFT.2008.20},
researchr = {https://researchr.org/publication/PolianRPTB08},
cites = {0},
citedby = {0},
pages = {245-253},
booktitle = {23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA},
editor = {Cristiana Bolchini and Yong-Bin Kim and Dimitris Gizopoulos and Mohammad Tehranipoor},
publisher = {IEEE Computer Society},
}