Heap Fuzzing: Automatic Garbage Collection Testing with Expert-Guided Random Events - researchr publication authors

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Guillermo Polito, Pablo Tesone, Nahuel Palumbo, Stéphane Ducasse, Jean Privat. Heap Fuzzing: Automatic Garbage Collection Testing with Expert-Guided Random Events. In IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023. pages 107-116, IEEE, 2023. [doi]

This author has not been identified. Look up 'Guillermo Polito' in GoogleThis author has not been identified. Look up 'Pablo Tesone' in GoogleThis author has not been identified. Look up 'Nahuel Palumbo' in GoogleThis author has not been identified. It may be one of the following persons:

Stéphane Ducasse

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