Guillermo Polito, Pablo Tesone, Nahuel Palumbo, Stéphane Ducasse, Jean Privat. Heap Fuzzing: Automatic Garbage Collection Testing with Expert-Guided Random Events. In IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023. pages 107-116, IEEE, 2023. [doi]
@inproceedings{PolitoTPDP23,
title = {Heap Fuzzing: Automatic Garbage Collection Testing with Expert-Guided Random Events},
author = {Guillermo Polito and Pablo Tesone and Nahuel Palumbo and Stéphane Ducasse and Jean Privat},
year = {2023},
doi = {10.1109/ICST57152.2023.00019},
url = {https://doi.org/10.1109/ICST57152.2023.00019},
researchr = {https://researchr.org/publication/PolitoTPDP23},
cites = {0},
citedby = {0},
pages = {107-116},
booktitle = {IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5666-1},
}