Guillermo Polito, Pablo Tesone, Nahuel Palumbo, Stéphane Ducasse, Jean Privat. Heap Fuzzing: Automatic Garbage Collection Testing with Expert-Guided Random Events. In IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023. pages 107-116, IEEE, 2023. [doi]
Abstract is missing.