Irith Pomeranz. Built-in generation of functional broadside tests. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1297-1302, IEEE, 2011. [doi]
@inproceedings{Pomeranz11-2, title = {Built-in generation of functional broadside tests}, author = {Irith Pomeranz}, year = {2011}, url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763208}, researchr = {https://researchr.org/publication/Pomeranz11-2}, cites = {0}, citedby = {0}, pages = {1297-1302}, booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011}, publisher = {IEEE}, isbn = {978-1-61284-208-0}, }