Irith Pomeranz. Scan Shift Power of Functional Broadside Tests. IEEE Trans. on CAD of Integrated Circuits and Systems, 30(9):1416-1420, 2011. [doi]
@article{Pomeranz11a-0,
title = {Scan Shift Power of Functional Broadside Tests},
author = {Irith Pomeranz},
year = {2011},
doi = {10.1109/TCAD.2011.2149890},
url = {http://dx.doi.org/10.1109/TCAD.2011.2149890},
researchr = {https://researchr.org/publication/Pomeranz11a-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {30},
number = {9},
pages = {1416-1420},
}