Irith Pomeranz. Generation of Mixed Broadside and Skewed-Load Diagnostic Test Sets for Transition Faults. In Leon Alkalai, Timothy Tsai, Tomohiro Yoneda, editors, 17th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2011, Pasadena, CA, USA, December 12-14, 2011. pages 45-52, IEEE Computer Society, 2011. [doi]
Abstract is missing.