Irith Pomeranz. Built-In Generation of Functional Broadside Tests Using a Fixed Hardware Structure. IEEE Trans. VLSI Syst., 21(1):124-132, 2013. [doi]
@article{Pomeranz13-1,
title = {Built-In Generation of Functional Broadside Tests Using a Fixed Hardware Structure},
author = {Irith Pomeranz},
year = {2013},
doi = {10.1109/TVLSI.2011.2179682},
url = {http://dx.doi.org/10.1109/TVLSI.2011.2179682},
researchr = {https://researchr.org/publication/Pomeranz13-1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {21},
number = {1},
pages = {124-132},
}