Irith Pomeranz. Compaction of a Transparent-Scan Sequence to Reduce the Fail Data Volume for Scan Chain Faults. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 133-138, IEEE Computer Society, 2017. [doi]
@inproceedings{Pomeranz17a-4,
title = {Compaction of a Transparent-Scan Sequence to Reduce the Fail Data Volume for Scan Chain Faults},
author = {Irith Pomeranz},
year = {2017},
doi = {10.1109/ATS.2017.35},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2017.35},
researchr = {https://researchr.org/publication/Pomeranz17a-4},
cites = {0},
citedby = {0},
pages = {133-138},
booktitle = {26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-2437-1},
}