Dynamically Determined Preferred Values and a Design-for-Testability Approach for Multiplexer Select Inputs under Functional Test Sequences

Irith Pomeranz. Dynamically Determined Preferred Values and a Design-for-Testability Approach for Multiplexer Select Inputs under Functional Test Sequences. ACM Trans. Design Autom. Electr. Syst., 23(5), 2018. [doi]

Abstract

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