Irith Pomeranz. Test Scores for Improving the Accuracy of Logic Diagnosis for Multiple Defects. IEEE Trans. VLSI Syst., 27(7):1720-1724, 2019. [doi]
@article{Pomeranz19b,
title = {Test Scores for Improving the Accuracy of Logic Diagnosis for Multiple Defects},
author = {Irith Pomeranz},
year = {2019},
doi = {10.1109/TVLSI.2019.2900836},
url = {https://doi.org/10.1109/TVLSI.2019.2900836},
researchr = {https://researchr.org/publication/Pomeranz19b},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {27},
number = {7},
pages = {1720-1724},
}