Irith Pomeranz. Padding of Multicycle Broadside and Skewed-Load Tests. IEEE Trans. VLSI Syst., 27(11):2587-2595, 2019. [doi]
@article{Pomeranz19d,
title = {Padding of Multicycle Broadside and Skewed-Load Tests},
author = {Irith Pomeranz},
year = {2019},
doi = {10.1109/TVLSI.2019.2924319},
url = {https://doi.org/10.1109/TVLSI.2019.2924319},
researchr = {https://researchr.org/publication/Pomeranz19d},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {27},
number = {11},
pages = {2587-2595},
}