Irith Pomeranz. Non-Masking Non-Robust Tests for Path Delay Faults. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{Pomeranz20a-1,
title = {Non-Masking Non-Robust Tests for Path Delay Faults},
author = {Irith Pomeranz},
year = {2020},
doi = {10.1109/VTS48691.2020.9107556},
url = {https://doi.org/10.1109/VTS48691.2020.9107556},
researchr = {https://researchr.org/publication/Pomeranz20a-1},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5359-9},
}