Irith Pomeranz. Broadside Tests for Transition and Stuck-At Faults. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(8):1739-1743, 2020. [doi]
@article{Pomeranz20c,
title = {Broadside Tests for Transition and Stuck-At Faults},
author = {Irith Pomeranz},
year = {2020},
doi = {10.1109/TCAD.2019.2935046},
url = {https://doi.org/10.1109/TCAD.2019.2935046},
researchr = {https://researchr.org/publication/Pomeranz20c},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {39},
number = {8},
pages = {1739-1743},
}