Irith Pomeranz. Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(12):5238-5246, 2020. [doi]
@article{Pomeranz20g,
title = {Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests},
author = {Irith Pomeranz},
year = {2020},
doi = {10.1109/TCAD.2020.2966452},
url = {https://doi.org/10.1109/TCAD.2020.2966452},
researchr = {https://researchr.org/publication/Pomeranz20g},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {39},
number = {12},
pages = {5238-5246},
}