Positive and Negative Extra Clocking of LFSR Seeds for Reduced Numbers of Stored Tests

Irith Pomeranz. Positive and Negative Extra Clocking of LFSR Seeds for Reduced Numbers of Stored Tests. In 30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021. pages 109-114, IEEE, 2021. [doi]

Authors

Irith Pomeranz

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