Irith Pomeranz. Functional Test Sequences as a Source for Partially Functional Launch-on-Shift Tests. IEEE Trans. VLSI Syst., 30(11):1803-1807, 2022. [doi]
@article{Pomeranz22b-0,
title = {Functional Test Sequences as a Source for Partially Functional Launch-on-Shift Tests},
author = {Irith Pomeranz},
year = {2022},
doi = {10.1109/TVLSI.2022.3198523},
url = {https://doi.org/10.1109/TVLSI.2022.3198523},
researchr = {https://researchr.org/publication/Pomeranz22b-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {30},
number = {11},
pages = {1803-1807},
}