Irith Pomeranz. Test Data Compression for Transparent-Scan Sequences. IEEE Trans. VLSI Syst., 31(4):601-605, April 2023. [doi]
@article{Pomeranz23c,
title = {Test Data Compression for Transparent-Scan Sequences},
author = {Irith Pomeranz},
year = {2023},
month = {April},
doi = {10.1109/TVLSI.2023.3240505},
url = {https://doi.org/10.1109/TVLSI.2023.3240505},
researchr = {https://researchr.org/publication/Pomeranz23c},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {31},
number = {4},
pages = {601-605},
}