Irith Pomeranz. Storage-Based Logic Built-In Self-Test With Partitioned Deterministic Compressed Tests. IEEE Trans. VLSI Syst., 31(9):1259-1268, September 2023. [doi]
@article{Pomeranz23d-0,
title = {Storage-Based Logic Built-In Self-Test With Partitioned Deterministic Compressed Tests},
author = {Irith Pomeranz},
year = {2023},
month = {September},
doi = {10.1109/TVLSI.2023.3285691},
url = {https://doi.org/10.1109/TVLSI.2023.3285691},
researchr = {https://researchr.org/publication/Pomeranz23d-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {31},
number = {9},
pages = {1259-1268},
}