A limited exponential complexity algorithm for increasing the testability of digital circuits by testing-module insertion

Irith Pomeranz, Zvi Kohavi. A limited exponential complexity algorithm for increasing the testability of digital circuits by testing-module insertion. IEEE Trans. on CAD of Integrated Circuits and Systems, 11(2):247-259, 1992. [doi]

Authors

Irith Pomeranz

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Zvi Kohavi

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