Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations

Irith Pomeranz, Sudhakar M. Reddy. Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. IEEE Trans. VLSI Syst., 12(7):780-788, 2004. [doi]

Authors

Irith Pomeranz

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Sudhakar M. Reddy

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