Irith Pomeranz, Sudhakar M. Reddy. Tuple Detection for Path Delay Faults: A Method for Improving Test Set Quality. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 41-46, IEEE Computer Society, 2005. [doi]
Abstract is missing.