Worst-Case and Average-Case Analysis of n-Detection Test Sets - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Irith Pomeranz, Sudhakar M. Reddy. Worst-Case and Average-Case Analysis of n-Detection Test Sets. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 444-449, IEEE Computer Society, 2005. [doi]

This author has not been identified. Look up 'Irith Pomeranz' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in Google

runs on WebDSL