Worst-Case and Average-Case Analysis of n-Detection Test Sets

Irith Pomeranz, Sudhakar M. Reddy. Worst-Case and Average-Case Analysis of n-Detection Test Sets. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 444-449, IEEE Computer Society, 2005. [doi]

Abstract

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