Diagnostic Test Generation Based on Subsets of Faults

Irith Pomeranz, Sudhakar M. Reddy. Diagnostic Test Generation Based on Subsets of Faults. In 12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany. pages 151-158, IEEE Computer Society, 2007. [doi]

Abstract

Abstract is missing.