Dynamic test compaction for a random test generation procedure with input cube avoidance - researchr publication authors

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Irith Pomeranz, Sudhakar M. Reddy. Dynamic test compaction for a random test generation procedure with input cube avoidance. In Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009. pages 672-677, IEEE, 2009. [doi]

This author has not been identified. Look up 'Irith Pomeranz' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in Google

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