Input Cubes with Lingering Synchronization Effects and their Use in Random Sequential Test Generation

Irith Pomeranz, Sudhakar M. Reddy. Input Cubes with Lingering Synchronization Effects and their Use in Random Sequential Test Generation. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 87-92, IEEE Computer Society, 2009. [doi]

@inproceedings{PomeranzR09-5,
  title = {Input Cubes with Lingering Synchronization Effects and their Use in Random Sequential Test Generation},
  author = {Irith Pomeranz and Sudhakar M. Reddy},
  year = {2009},
  doi = {10.1109/ETS.2009.19},
  url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2009.19},
  tags = {synchronization, testing, random testing},
  researchr = {https://researchr.org/publication/PomeranzR09-5},
  cites = {0},
  citedby = {0},
  pages = {87-92},
  booktitle = {14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009},
  publisher = {IEEE Computer Society},
  isbn = {978-0-7695-3703-0},
}