TOV: Sequential Test Generation by Ordering of Test Vectors

Irith Pomeranz, Sudhakar M. Reddy. TOV: Sequential Test Generation by Ordering of Test Vectors. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(3):454-465, 2010. [doi]

Authors

Irith Pomeranz

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Sudhakar M. Reddy

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