Irith Pomeranz, Sudhakar M. Reddy. On Test Generation With Test Vector Improvement. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(3):502-506, 2010. [doi]
@article{PomeranzR10a-1,
title = {On Test Generation With Test Vector Improvement},
author = {Irith Pomeranz and Sudhakar M. Reddy},
year = {2010},
doi = {10.1109/TCAD.2010.2041853},
url = {http://dx.doi.org/10.1109/TCAD.2010.2041853},
tags = {testing},
researchr = {https://researchr.org/publication/PomeranzR10a-1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {29},
number = {3},
pages = {502-506},
}