On Generating Test Sets that Remain Valid in the Presence of Undetected Faults

Irith Pomeranz, Sudhakar M. Reddy. On Generating Test Sets that Remain Valid in the Presence of Undetected Faults. In 7th Great Lakes Symposium on VLSI (GLS-VLSI 97), 13-15 March 1997, Urbana, IL, USA. pages 20-25, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.