Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling - researchr publication authors

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Irith Pomeranz, Sudhakar M. Reddy. Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling. In 8th Great Lakes Symposium on VLSI (GLS-VLSI 98), 19-21 February 1998, Lafayette, LA, USA. pages 216-221, IEEE Computer Society, 1998. [doi]

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