PASTA: Partial Scan to Enhance Test Compaction

Irith Pomeranz, Sudhakar M. Reddy. PASTA: Partial Scan to Enhance Test Compaction. In 9th Great Lakes Symposium on VLSI (GLS-VLSI 99), 4-6 March 1999, Ann Arbor, MI, USA. pages 4-7, IEEE Computer Society, 1999. [doi]

Abstract

Abstract is missing.