On avoiding undetectable faults during test generation

Irith Pomeranz, Sudhakar M. Reddy. On avoiding undetectable faults during test generation. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 90-95, IEEE Computer Society, 1999. [doi]

Authors

Irith Pomeranz

This author has not been identified. Look up 'Irith Pomeranz' in Google

Sudhakar M. Reddy

This author has not been identified. Look up 'Sudhakar M. Reddy' in Google