On avoiding undetectable faults during test generation

Irith Pomeranz, Sudhakar M. Reddy. On avoiding undetectable faults during test generation. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 90-95, IEEE Computer Society, 1999. [doi]

@inproceedings{PomeranzR99-0,
  title = {On avoiding undetectable faults during test generation},
  author = {Irith Pomeranz and Sudhakar M. Reddy},
  year = {1999},
  doi = {10.1109/ETW.1999.804292},
  url = {https://doi.org/10.1109/ETW.1999.804292},
  researchr = {https://researchr.org/publication/PomeranzR99-0},
  cites = {0},
  citedby = {0},
  pages = {90-95},
  booktitle = {4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-0390-X},
}