On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults

Irith Pomeranz, Sudhakar M. Reddy. On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 173-181, IEEE Computer Society, 1999. [doi]

Authors

Irith Pomeranz

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Sudhakar M. Reddy

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