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Irith Pomeranz, Sudhakar M. Reddy. On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 173-181, IEEE Computer Society, 1999. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On Bias in Transition Coverage of Test Sets for Path Delay FaultsIrith Pomeranz, Sudhakar M. Reddy. ats 2010: 349-352 [doi] On n-detection test sets and variable n-detection test sets fortransition faultsIrith Pomeranz, Sudhakar M. Reddy. tcad, 19(3):372-383, 2000. [doi] Transforming an $n$-Detection Test Set into a Test Set for a Variety of Fault ModelsIrith Pomeranz. itc 2022: 474-478 [doi]
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