Transforming an $n$-Detection Test Set into a Test Set for a Variety of Fault Models

Irith Pomeranz. Transforming an $n$-Detection Test Set into a Test Set for a Variety of Fault Models. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 474-478, IEEE, 2022. [doi]

Abstract

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