Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults - researchr publication authors

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Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen. Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 475-480, IEEE Computer Society, 2004. [doi]

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